Circuit Design for Reliability
Author:   Ricardo Reis ,  Yu Cao ,  Gilson Wirth
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2015
ISBN:  

9781493941568


Pages:   272
Publication Date:   22 September 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Circuit Design for Reliability


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Author:   Ricardo Reis ,  Yu Cao ,  Gilson Wirth
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2015
Weight:   4.787kg
ISBN:  

9781493941568


ISBN 10:   1493941569
Pages:   272
Publication Date:   22 September 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

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