Characterization and Control of Interfaces for High Quality Advanced Materials
Author:   Kevin Ewsuk (Sandia National Laboratories) ,  Kiyoshi Nogi (Osaka University) ,  Markus Reiterer (Sandia National Loboratories) ,  Antoni Tomsia (Lawrence Berkeley Laboratory)
Publisher:   John Wiley & Sons Inc
Volume:   v. 146
ISBN:  

9781574981704


Pages:   504
Publication Date:   16 March 2006
Format:   Paperback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Characterization and Control of Interfaces for High Quality Advanced Materials


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Author:   Kevin Ewsuk (Sandia National Laboratories) ,  Kiyoshi Nogi (Osaka University) ,  Markus Reiterer (Sandia National Loboratories) ,  Antoni Tomsia (Lawrence Berkeley Laboratory)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-American Ceramic Society
Volume:   v. 146
Dimensions:   Width: 15.30cm , Height: 2.60cm , Length: 23.40cm
Weight:   0.674kg
ISBN:  

9781574981704


ISBN 10:   1574981706
Pages:   504
Publication Date:   16 March 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Kevin Ewsuk is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Kiyoshi Nogi is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Markus Reiterer is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Antoni Tomsia is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. S. Jill Glass is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Rolf Waesche is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Keizo Uematsu is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley. Makio Naito is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

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