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Author:   Wolfgang S. M. Werner
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Wiley-VCH Verlag GmbH
Dimensions:   Width: 170.00cm , Height: 170.00cm , Length: 240.00cm
ISBN:  

9783527317608

ISBN 10:   3527317600
Pages:   400
Publication Date:   09 March 2021
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

SECTION I INTRODUCTION Introduction: Survey of the Fields of Application, Introduction of Physical Analysis Methods SECTION II FUNDAMENTALS Electron Beam Techniques Fundamentals of the Electron-Solid Interaction Auger Electron Spectroscopy X-ray Photoelectron Spectroscopy Electron Probe Microanalysis Transmission Electron Microscopy Ion Beam Techniques Fundamentals of the Ion-Solid Interaction Rutherford Backscattering Spectrometry Elastic Recoil Detection Ion Scattering Spectroscopy Secondary Ion Mass Spectrometry Nuclear Techniques Scanning Probe Microscopy Scanning Tunneling Microscopy Atomic Force Microscopy Other Scanning Probe Microscopy Techniques SECTION III APPLICATIONS Sample Preparation Techniques Semiconductors Magnetic Materials Catalysis Metallurgy Tribology Oxidation Corrosion Polymers Adhesion Biomaterials Metrology Environmental Analysis Areospace Technology Archeometry Outlook

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Author Information

Masters degree in physics at the Rijksuniversiteit Utrecht in the Netherlands 1988. PhD in Technical Physics at the Technical University Vienna 1991, senior research engineer with Digital Equipment Corporation in Massachusetts, US. At present: Assistant Professor at the Institut für Allgemeine Physik, Vienna University of Technology. Over 100 papers published in scientific journals and edited books.

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