Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Author:   Yonghua Rong
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2012
ISBN:  

9783642201189


Pages:   570
Publication Date:   05 March 2012
Format:   Hardback
Availability:   Awaiting stock   Availability explained
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Characterization of Microstructures by Analytical Electron Microscopy (AEM)


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Overview

""Characterization of Microstructures by Analytical Electron Microscopy (AEM)"" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics. Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Full Product Details

Author:   Yonghua Rong
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2012
Dimensions:   Width: 15.50cm , Height: 3.60cm , Length: 23.50cm
Weight:   0.998kg
ISBN:  

9783642201189


ISBN 10:   3642201180
Pages:   570
Publication Date:   05 March 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

Table of Contents

The Analytical Electron Microscope (AEM).- Specimen Preparation.- Electron Diffraction.- Mathematics Analysis in Electron Diffraction and Crystallography.- Diffraction Contrast.- High Resolution and High Spatial Resolution of Analytical Electron Microscopy.

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