Characterisation of Radiation Damage by Transmission Electron Microscopy
Author:   M L Jenkins ,  M a Kirk
Publisher:   CRC Press
ISBN:  

9786610650675


Pages:   234
Publication Date:   21 November 2000
Format:   Electronic book text
Availability:   Out of stock   Availability explained
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Characterisation of Radiation Damage by Transmission Electron Microscopy


Overview

This work aims to describe the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion-implantation of semiconductors.

Full Product Details

Author:   M L Jenkins ,  M a Kirk
Publisher:   CRC Press
Imprint:   CRC Press
ISBN:  

9786610650675


ISBN 10:   6610650675
Pages:   234
Publication Date:   21 November 2000
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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