Built In Test for VLSI: Pseudorandom Techniques
Author:   Paul H. Bardell (IBM Corporation, Armonk, NY) ,  W. H. McAnney (IBM Corporation, Armonk, NY) ,  J. Savir (IBM Corporation, Armonk, NY) ,  J. Savir
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471624639


Pages:   368
Publication Date:   02 December 1987
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Our Price $467.95 Quantity:  
Add to Cart

Share |

Built In Test for VLSI: Pseudorandom Techniques


Overview

Full Product Details

Author:   Paul H. Bardell (IBM Corporation, Armonk, NY) ,  W. H. McAnney (IBM Corporation, Armonk, NY) ,  J. Savir (IBM Corporation, Armonk, NY) ,  J. Savir
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Interscience
Dimensions:   Width: 16.50cm , Height: 2.30cm , Length: 24.00cm
Weight:   0.610kg
ISBN:  

9780471624639


ISBN 10:   0471624632
Pages:   368
Publication Date:   02 December 1987
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Reviews

Author Information

Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

NOV RG 20252

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now