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OverviewFull Product DetailsAuthor: Patrizio Campisi (Universita degli Studi ""Roma TRE,"" Italy) , Karen Egiazarian (Tampere University of Technology, Finland) , Aggelos K. Katsaggelos (Northwestern University, Evanston, Illinois, USA) , Karen Egiazarian (Tampere University of Technology, Finland)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Dimensions: Width: 15.60cm , Height: 2.50cm , Length: 23.40cm Weight: 0.771kg ISBN: 9780849373671ISBN 10: 0849373670 Pages: 472 Publication Date: 14 May 2007 Audience: Professional and scholarly , Professional and scholarly , Professional & Vocational , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsThree titles from CRC Press look of interest, though I have not seen the books themselves! P.Campisi and K. Egiazarian have edited a collection of 10 essays on Blind Image Deconvolution, Theory and Applications! --P.W. Hawkes in Ultramicroscopy 108 (2008) Author InformationPatrizio Campisi, Karen Egiazarian Tab Content 6Author Website:Countries AvailableAll regions |