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9780849328992

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It should be noted that any solution to an inverse problem in any field helps better understand the direct problem and can give more benefits, for example, reconstruction of an object in topography. This book is the first compiled work in this direction ... written in a reader-friendly style ... the material is well structured and illustrated. In particular, examples are short, clear, and well placed; summaries give the quintessence of each chapter; problems are useful for detail study. I found especially useful the recommendations and comments for further reading provided in each chapter ... this book can be recognized as an important event in the biometric community and related areas, including pattern recognition. -Patrick S. Wang, IAPR (International Association for Pattern Recognition) Newsletter, Vol. 28, No. 4, October 2006

"""It should be noted that any solution to an inverse problem in any field helps better understand the direct problem and can give more benefits, for example, reconstruction of an object in topography. This book is the first compiled work in this direction … written in a reader-friendly style … the material is well structured and illustrated. In particular, examples are short, clear, and well placed; summaries give the quintessence of each chapter; problems are useful for detail study. I found especially useful the recommendations and comments for further reading provided in each chapter … this book can be recognized as an important event in the biometric community and related areas, including pattern recognition."" -Patrick S. Wang, IAPR (International Association for Pattern Recognition) Newsletter, Vol. 28, No. 4, October 2006"

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Svetlana N. Yanushkevich, Adrian Stoica, Vlad P. Shmerko, Denis V. Popel, Elizabeth Lynn

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