Bias Temperature Instability for Devices and Circuits
Author:   Tibor Grasser
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2014
ISBN:  

9781493955299


Pages:   810
Publication Date:   01 October 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Bias Temperature Instability for Devices and Circuits


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Author:   Tibor Grasser
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2014
Weight:   1.662kg
ISBN:  

9781493955299


ISBN 10:   1493955292
Pages:   810
Publication Date:   01 October 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Characterization, Experimental Challenges.- Advanced Characterization.- Characterization of Nanoscale Devices.- Statistical Properties/Variability.- Theoretical Understanding.- Possible Defects: Experimental.- Possible Defects: First Principles.- Modeling.- Technological Impact.- Silicon dioxides/SiON.- High-k oxides.- Alternative technologies.- Circuits.

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