Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Author:   W Czanderna Alvin
Publisher:   Springer
ISBN:  

9781280204951


Pages:   430
Publication Date:   01 January 1998
Format:   Undefined
Availability:   Available To Order   Availability explained
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis


Overview

This introductory text describes the principles, techniques, and methods vital for efficient surface analysis.

Full Product Details

Author:   W Czanderna Alvin
Publisher:   Springer
Imprint:   Springer
ISBN:  

9781280204951


ISBN 10:   1280204958
Pages:   430
Publication Date:   01 January 1998
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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