Bayesian Networks for Reliability Engineering

Author:   Baoping Cai ,  Yonghong Liu ,  Zengkai Liu ,  Yuanjiang Chang
Publisher:   Springer Verlag, Singapore
Edition:   1st ed. 2020
ISBN:  

9789811365157


Pages:   257
Publication Date:   08 March 2019
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Bayesian Networks for Reliability Engineering


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Overview

 This book presents a bibliographical review of the use of Bayesian networks in reliability over the last decade. Bayesian network (BN) is considered to be one of the most powerful models in probabilistic knowledge representation and inference, and it is increasingly used in the field of reliability. After focusing on the engineering systems, the book subsequently discusses twelve important issues in the BN-based reliability methodologies, such as BN structure modeling, BN parameter modeling, BN inference, validation, and verification. As such, it is a valuable resource for researchers and practitioners in the field of reliability engineering.

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Author:   Baoping Cai ,  Yonghong Liu ,  Zengkai Liu ,  Yuanjiang Chang
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   1st ed. 2020
Weight:   0.571kg
ISBN:  

9789811365157


ISBN 10:   9811365156
Pages:   257
Publication Date:   08 March 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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"Baoping Cai is an associate professor at the China University of Petroleum (East China), a visiting researcher of the ""Hong Kong Scholar"" program at the City University of Hong Kong, and a visiting researcher at the Norwegian University of Science and Technology. He is an associate editor of IEEE Access (SCI journal) and Human-Centric Computing and Information Sciences (SCI journal), an editorial board member of 3 international journals, and a leading guest editor of 1 international journal. His research interests include reliability engineering, fault diagnosis, risk analysis, and Bayesian networks methodology and application. Up to now, he has published 65 SCI-index journal papers, 4 monographs, and holds 37 patents."

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