Overview

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Full Product Details

Author:   Samuel H. Cohen ,  Marcia L. Lightbody
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1997 ed.
Dimensions:   Width: 17.80cm , Height: 1.60cm , Length: 25.40cm
Weight:   1.610kg
ISBN:  

9780306455964

ISBN 10:   030645596
Pages:   250
Publication Date:   30 April 1997
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Keynote Address: Scanned Probe Microscopy; M.F. Crommie. Semiconductor Characterization and Adsorbate Characterization: Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection; S.Y. Hong. Scanning Tunneling Microscopy-based Fabrication of Nanometer Scale Structures; M.H. Nayfeh. Biological and Chemical Nanostructure: Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope; K.M. Shakesheff, et al. Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfaces; T. Fritz, et al. New Developments in AFM/STM: Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope; M. Hietschold, et al. Observing Reactions via Flow Injection Scanning Tunneling Microscopy; J.D. Noll, et al. AFM/STM in Materials Science: Applications of Atomic Force Microscopy in Optical Fiber Research; Q. Zhong, D. Inniss. Atomic Force Microscopy Studies on Optical Fibers; M.J. Matthewson, et al. 19 additional articles. Index.

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