Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations
Author:   Wesley C. Sanders (Salt Lake Community College, UT, USA)
Publisher:   Taylor & Francis Ltd
ISBN:  

9780367371234


Pages:   139
Publication Date:   14 October 2019
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations


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Author:   Wesley C. Sanders (Salt Lake Community College, UT, USA)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.380kg
ISBN:  

9780367371234


ISBN 10:   0367371235
Pages:   139
Publication Date:   14 October 2019
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes of AFM 9. Image Processing

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Author Information

Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.

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