Overview
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to ""Scanning Probe Microscopy"" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Full Product Details
Author: Bert Voigtländer
Publisher: Springer Nature Switzerland AG
Imprint: Springer Nature Switzerland AG
Edition: 2nd ed. 2019
Weight: 0.534kg
ISBN: 9783030136567
ISBN 10: 3030136566
Pages: 331
Publication Date: 14 August 2020
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Paperback
Publisher's Status: Active
Availability: Manufactured on demand
We will order this item for you from a manufactured on demand supplier.
Reviews
“Whether readers are just starting in the field or running an atomic force microscope daily, Voigtländer’s Atomic Force Microscopy will be an excellent companion. It will usefully complement the user manual or the application notes of any instrument. I wish it had been available when I was beginning my journey in nanoscience instrumentation 15 years ago, and I will certainly use it as a reference book for all the students coming through our laboratory’s door from now on.” (Ludovic Bellon, Physics Today, Vol. 73 (5), May, 2020)
Voigtlander's Atomic Force Microscopy will be an excellent companion. ... I wish it had been available when I was beginning my journey in nanoscience instrumentation 15 years ago, and I will certainly use it as a reference book for all the students coming through our laboratory's door from now on. (Ludovic Bellon, Physics Today, Vol. 73 (5), May, 2020)
Author Information
Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.
