Atomic Force Microscopy
Author:   Greg Haugstad
Publisher:   Wiley
ISBN:  

9781283646024


Pages:   488
Publication Date:   01 January 2012
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Atomic Force Microscopy


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Overview

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com

Full Product Details

Author:   Greg Haugstad
Publisher:   Wiley
Imprint:   Wiley
ISBN:  

9781283646024


ISBN 10:   1283646021
Pages:   488
Publication Date:   01 January 2012
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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