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OverviewFull Product DetailsAuthor: Michael K. Miller , Richard G. ForbesPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of the original 1st ed. 2014 Weight: 0.908kg ISBN: 9781489977908ISBN 10: 1489977902 Pages: 423 Publication Date: 17 September 2016 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |