Overview

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Full Product Details

9780198513872

Table of Contents

Reviews

The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level. T. Mulvey, Measurement Science Technology 8 (1997) For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields. Aslib Book Guide, vol.61, no.12, December 1996.

For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields. * Aslib Book Guide, vol.61, no.12, December 1996. * The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level. * T. Mulvey, Measurement Science Technology 8 (1997) *

Author Information

Hetherington - deceased

Tab Content 6

Customer Reviews

Recent Reviews

Countries Available