Overview

Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.

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9783540873044

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<p>From the reviews: <p> The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book... This is an excellent book for all users of SPM interested in real technological applications. <br>Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle<br>Journal: The Physicist, Vol. 41, No. 6, p. 200<p> This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout . It is therefore effective when read as a whole but will also find good use as a reference book. This is an excellent book for all users of SPM interested in real technological applications. (Steven R Schofield, The Physicist, Vol. 41 (6), November/De

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