Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves

Author:   Sivakumar Alagumalai ,  David D. Curtis ,  Njora Hungi
Publisher:   Springer-Verlag New York Inc.
Edition:   2005 ed.
Volume:   4
ISBN:  

9781402030727


Pages:   360
Publication Date:   15 February 2005
Format:   Hardback
Availability:   In Print   Availability explained
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Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves


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Overview

While the primary purpose of the book is a celebration of John’s contributions to the field of measurement, a second and related purpose is to provide a useful resource. We believe that the combination of the developmental history and theory of the method, the examples of its use in practice, some possible future directions, and software and data files will make this book a valuable resource for teachers and scholars of the Rasch method. This book is a tribute to Professor John P Keeves for the advocacy of the Rasch model in Australia. Happy 80th birthday John! xii There are good introductory texts on Item Response Theory, Objective Measurement and the Rasch model. However, for a beginning researcher keen on utilising the potentials of the Rasch model, theoretical discussions of test theory and associated indices do not meet their pragmatic needs. Furthermore, many researchers in measurement still have little or no knowledge of the features of the Rasch model and its use in a variety of situations and disciplines. This book attempts to describe the underlying axioms of test theory, and, in particular, the concepts of objective measurement and the Rasch model, and then link theory to practice. We have been introduced to the various models of test theory during our graduate days. It was time for us to share with those keen in the field of measurement in education, psychology and the social sciences the theoretical and practical aspects of objective measurement.

Full Product Details

Author:   Sivakumar Alagumalai ,  David D. Curtis ,  Njora Hungi
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2005 ed.
Volume:   4
Dimensions:   Width: 15.50cm , Height: 2.20cm , Length: 23.50cm
Weight:   1.560kg
ISBN:  

9781402030727


ISBN 10:   140203072
Pages:   360
Publication Date:   15 February 2005
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Measurement and the Rasch model.- Classical Test Theory.- Objective Measurement.- The Rasch Model Explained.- Applications of the Rasch Model — Tests and Competencies.- Monitoring Mathematics Achievement over Time.- Manual and Automatic Estimates of Growth and Gain Across Year Levels: How Close is Close?.- Japanese Language Learning and the Rasch Model.- Chinese Language Learning and the Rasch Model.- Employing the Rasch Model to Detect Biased Items.- Raters and Examinations.- Comparing Classical and Contemporary Analyses and Rasch Measurement.- Combining Rasch Scaling and Multi-Level Analysis.- Applications of the Rasch Model — Attitudes Scales and Views.- Rasch and Attitude Scales: Explanatory Style.- Science Teachers’ Views on Science, Technology and Society Issues.- Estimating the Complexity of Workplace Rehabilitation Tasks Using Rasch Analysis.- Creating a Scale as a General Measure of Satisfaction for Information and Communication Technology Users.- Extensions of the Rasch model.- Multidimensional Item Responses: Multimethod-Multitrait Perspectives.- Information Functions for the General Dichotomous Unfolding Model.- Past, Present and Future: An Idiosyncratic View of Rasch Measurement.- Epilogue.- Our Experiences and Conclusion.

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