Applications of X-Ray Topographic Methods to Materials Science

Author:   Sigmund Weissmann ,  Francoise Balibar ,  Jean-Francois Petroff
Publisher:   Plenum Publishing Corporation
ISBN:  

9780306418389


Pages:   536
Publication Date:   01 December 1984
Format:   Hardback
Availability:   Out of stock   Availability explained


Our Price $551.76 Quantity:  
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Applications of X-Ray Topographic Methods to Materials Science


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Author:   Sigmund Weissmann ,  Francoise Balibar ,  Jean-Francois Petroff
Publisher:   Plenum Publishing Corporation
Imprint:   Plenum Publishing Corporation
Weight:   1.141kg
ISBN:  

9780306418389


ISBN 10:   030641838
Pages:   536
Publication Date:   01 December 1984
Audience:   General/trade ,  General
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Out of stock   Availability explained

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NOV RG 20252

 

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