Analytical Electron Microscopy for Materials Science
Author:   DAISUKE Shindo ,  T. Oikawa
Publisher:   Springer Verlag, Japan
Edition:   2002 ed.
ISBN:  

9784431703365


Pages:   152
Publication Date:   20 September 2002
Format:   Paperback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Analytical Electron Microscopy for Materials Science


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Overview

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Full Product Details

Author:   DAISUKE Shindo ,  T. Oikawa
Publisher:   Springer Verlag, Japan
Imprint:   Springer Verlag, Japan
Edition:   2002 ed.
Dimensions:   Width: 21.00cm , Height: 0.90cm , Length: 28.00cm
Weight:   0.428kg
ISBN:  

9784431703365


ISBN 10:   4431703365
Pages:   152
Publication Date:   20 September 2002
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

1. Basic Principles of Analytical Electron Microscopy.- 2. Constitution and Basic Operation of Analytical Electron Microscopes.- 3. Electron Energy-Loss Spectroscopy.- 4. Energy Dispersive X-ray Spectroscopy.- 5. Peripheral Instruments and Techniques for Analytical Electron Microscopy.- Appendix A: Physical Constants, Conversion Factors, Electron Wavelengths.- Appendix B: Electron Binding Energies and Characteristic X-ray Energies.- Appendix C. Vacuum System.

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