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OverviewExtensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms. Full Product DetailsAuthor: John F. Watts , John WolstenholmePublisher: John Wiley and Sons Ltd Imprint: John Wiley & Sons Ltd Edition: 2nd Revised edition Dimensions: Width: 16.70cm , Height: 1.40cm , Length: 23.10cm Weight: 0.338kg ISBN: 9780470847138ISBN 10: 0470847131 Pages: 226 Publication Date: 25 March 2003 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Out of print, replaced by POD ![]() We will order this item for you from a manufatured on demand supplier. Table of ContentsPreface. Acknowledgements. Electron Spectroscopy: Some Basic Concepts. Electron Spectrometer Design. The Electron Spectrum: Qualitative and Quantitative Interpretation. Compositional Depth Profiling. Applications of Electron Spectroscopy in Materials Science. Comparison of XPS and AES with Other Analytical Techniques. Glossary. Bibliography.ReviewsAuthor InformationJohn F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis. John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years. Tab Content 6Author Website:Countries AvailableAll regions |