An Empirical Study of Re-Sampling Techniques as a Method for Improving Error Estimates in Split-Plot Designs

Author:   Benjamin M Lee
Publisher:   Hutson Street Press
ISBN:  

9781025093741


Pages:   244
Publication Date:   22 May 2025
Format:   Paperback
Availability:   Available To Order   Availability explained
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An Empirical Study of Re-Sampling Techniques as a Method for Improving Error Estimates in Split-Plot Designs


Overview

For any acquisition program, whether Department of Defense (DOD) or industry related, the primary driving factor behind the success of a program is whether or not the program remains within budget, stays on schedule and meets the defined performance requirements. If any of these three criteria are not met, the program manager may need to make challenging decisions. Typically, if the program is expected to not stay within budget or is expected to be delayed for one reason or another, the program manager will tend to limit areas of testing in order to meet these criteria. The result tends to be a reduction in the test budget and/or a shortening in the test timeline, both of which are already lean. The T and E community needs new test methodologies to test systems and gain insight on whether a system meets performance standards, within the budget and timeline constraints. In particular, both fundamental and advanced aspects of experimental design need to be adapted. The use of experiential design within DOD has continued to grow because of the needed adaptation. Many different types of experiments have been used. An experimental design that is often needed is one that involves a restricted randomization design such as a split-plot design. Split-plot designs arise when specific factors are difficult (or impossible) to vary, a frequent occurrence within the T and E community. This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.

Full Product Details

Author:   Benjamin M Lee
Publisher:   Hutson Street Press
Imprint:   Hutson Street Press
Dimensions:   Width: 15.60cm , Height: 1.30cm , Length: 23.40cm
Weight:   0.345kg
ISBN:  

9781025093741


ISBN 10:   1025093747
Pages:   244
Publication Date:   22 May 2025
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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