Advances in X-Ray Analysis: Volume 27
Author:   Jerome B. Cohen
Publisher:   Springer Science+Business Media
Edition:   1984 ed.
ISBN:  

9780306417122


Pages:   596
Publication Date:   01 June 1984
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Advances in X-Ray Analysis: Volume 27


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Author:   Jerome B. Cohen
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1984 ed.
Weight:   1.200kg
ISBN:  

9780306417122


ISBN 10:   030641712
Pages:   596
Publication Date:   01 June 1984
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

I. J. D. Hanawalt Award Session On Search/Match Methods.- II. X-Ray Strain and Stress Determination.- III. Position Sensitive Detectors and X-Ray Instrumentation.- IV. Quantitative Phase Analysis by XRD.- V. Other XRD Applications.- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- VII. Mathematical Models and Computer Applications in XRF.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- IX. Other XRF Applications.- Author Index.

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