Advances in X-Ray Analysis: Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991
Author:   Charles S. Barrett ,  John V. Gilfrich ,  Ting C. Huang ,  Ron Jenkins
Publisher:   Springer Science+Business Media
ISBN:  

9780306442490


Pages:   1334
Publication Date:   01 October 1992
Format:   Hardback
Availability:   Out of stock   Availability explained
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Advances in X-Ray Analysis: Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991


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Overview

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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Author:   Charles S. Barrett ,  John V. Gilfrich ,  Ting C. Huang ,  Ron Jenkins
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Weight:   2.760kg
ISBN:  

9780306442490


ISBN 10:   0306442493
Pages:   1334
Publication Date:   01 October 1992
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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