Advances in X-Ray Analysis: Volume 33
Author:   Charles S. Barrett ,  John V. Gilfrich ,  Ting C. Huang ,  Ron Jenkins
Publisher:   Springer Science+Business Media
Edition:   1990 ed.
ISBN:  

9780306436154


Pages:   704
Publication Date:   01 June 1990
Format:   Hardback
Availability:   Out of stock   Availability explained
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Advances in X-Ray Analysis: Volume 33


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Author:   Charles S. Barrett ,  John V. Gilfrich ,  Ting C. Huang ,  Ron Jenkins
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1990 ed.
Weight:   1.430kg
ISBN:  

9780306436154


ISBN 10:   0306436159
Pages:   704
Publication Date:   01 June 1990
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

I. Characterization of Epitaxial Thin Films and Crystal Defects by X-Ray Diffraction.- II. XRD Characterization of Polycrystalline Thin Films.- III. X-Ray Spectrometric Characterization of Thin Films.- IV. Analysis of Digital Diffraction Data Including Rietveld.- V. X-Ray Stress Analysis.- VI. Determination of Crystallite Size and Strain.- VII. Phase Identification, Structural and Quantitative Analysis by Diffraction.- VIII. X-Ray Spectrometry Data Analysis.- IX. XRF Instrumentation.- X. XRF Techniques for Hazardous Wastes and Other Applications.- Author Index.

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