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OverviewThis book comprises the proceedings of the Conference and Exhibition on Non Destructive Evaluation, (NDE 2019). The contents of the book encompass a vast spectrum from Conventional to Advanced NDE including novel methods, instrumentation, sensors, procedures and data analytics as applied to all industry segments for quality control, periodic maintenance, life estimation, structural integrity and related areas. This book will be a useful reference for students, researchers and practitioners. Full Product DetailsAuthor: C. K. Mukhopadhyay , Ravibabu MulaveesalaPublisher: Springer Verlag, Singapore Imprint: Springer Verlag, Singapore Edition: 1st ed. 2021 Weight: 0.623kg ISBN: 9789811601859ISBN 10: 9811601852 Pages: 394 Publication Date: 29 June 2021 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationDr. C. K. Mukhopadhyay is currently Head, Non Destructive Evaluation Division of Metallurgy and Materials Group, Indira Gandhi Centre for Atomic Research (IGCAR). He is also Professor at Homi Bhabha National Institute, India. He pursued his B.E. from the University of Calcutta (1982) and Ph.D. from Indian Institute of Technology Kharagpur (2003) in Metallurgical Engineering. His research interests include non-destructive evaluation techniques, materials & defect characterization, deformation & crack growth, structural integrity monitoring & failure analysis. He has over 150 publications in peer-reviewed journals and conferences. He has guided nearly 20 M.Tech. and B.Tech. theses and is currently guiding 6 Ph.D. scholars. Dr. Ravibabu Mulaveesala is currently Associate Professor with the Department of Electrical Engineering, Indian Institute of Technology (IIT) Ropar, India. He received the B.Sc. in Electronics from Maha Raja College in 1996, M.Sc. in Electronics from Nagarjuna University in 1998, M.Tech. from National Institute of Technology (NIT), Tiruchirappalli, in 2000, and Ph.D. from Indian Institute of Technology (IIT) Delhi, India, in 2006. His research interests include development of thermal, acoustical and optical non-invasive/non-destructive testing technologies for bio-medical and industrial imaging applications. He serves on the editorial/advisory boards of several refereed journals of national and international repute. Tab Content 6Author Website:Countries AvailableAll regions |
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