|
|
|||
|
||||
OverviewFull Product DetailsAuthor: Attilio Frangi (Politecnico Di Milano, Italy) , Subrata Mukherjee (Cornell Univ, Usa) , Carlo Cercignani (Politecnico Di Milano, Italy) , Narayan R Aluru (Univ Of Illinois At Urbana-champaign, Usa)Publisher: Imperial College Press Imprint: Imperial College Press Volume: 2 Dimensions: Width: 15.50cm , Height: 3.30cm , Length: 23.10cm Weight: 0.862kg ISBN: 9781860948626ISBN 10: 1860948626 Pages: 504 Publication Date: 31 July 2008 Audience: College/higher education , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsChallenges in Modeling Liquid and Gas Flows in Micro/Nanodevices (M Gad-El-Hak); Using the Kinetic Equations for MEMS and NEMS (C Cercignani et al.); Applying the Direct Simulation Monte Carlo (DSMC) Method to Gas-Filled MEMS Devices (M Gallis); New Approaches for the Simulation of Microfluidics in MEMS (H Li); Evaluating Gas Damping in MEMS Using Fast Integral Equation Solvers (J White et al.); Experimental Techniques for Damping Characterization of Micro and Nanostructures (A Bosseboeuf & H Mathias); Nonlinear Dynamics of Electrostatically Actuated MEMS (N Aluru & S K De); Coupled Deformation Analysis of Thin MEMS Plates (S Mukherjee & S Telukunta); Pull-In Instability in Electrostatically Actuated MEMS (R Batra & D Spinello); Numerical Simulation of BIOMEMS with Dielectrophoresis (G R Liu & C X Song); Continuous Modeling of Multiphysics Problems of Microsystems for Topology Optimization (G K Ananthasuresh); Mechanical Characterization of Polysilicon at the Microscale Through On-Chip Tests (A Corigliano et al.); Nanoscale Testing of Nanowires and Carbon Nanotubes Using a Microelectromechanical System (H Espinosa et al.).ReviewsThis book would be of interest to those in academic or industrial research that model MEMS devices. The book will provide some of the latest methods used to model these devices along with some experimental methods used to characterize MEMS. -- IEEE Electrical Insulation Magazine IEEE Electrical Insulation Magazine "This book would be of interest to those in academic or industrial research that model MEMS devices. The book will provide some of the latest methods used to model these devices along with some experimental methods used to characterize MEMS. -- IEEE Electrical Insulation Magazine ""IEEE Electrical Insulation Magazine""" Author InformationTab Content 6Author Website:Countries AvailableAll regions |
||||