Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Full Product Details

Author:   Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Volume:   168
Dimensions:   Width: 15.20cm , Height: 2.30cm , Length: 22.90cm
Weight:   0.680kg
ISBN:  

9780123859839

ISBN 10:   0123859832
Pages:   392
Publication Date:   27 September 2011
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach LucaGeretti, AntonioAbramo Logarithmic Image Processing for Color Images M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography Rainer A. Leitgeb Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy S.A. Nepijko, G. Schoenhense Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Parish Aberration Correctors developed under Triple C Project Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga Spatially resolved thermoluminescence in a scanning electron microscope T. Schulz, M. Albrecht, K.Irmscher

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Author Information

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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