Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Author:   Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)
Publisher:   Elsevier Science Publishing Co Inc
Edition:   161st edition
Volume:   162
ISBN:  

9780123813169


Pages:   296
Publication Date:   06 August 2010
Format:   Hardback
Availability:   In Print   Availability explained
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers


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Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Author:   Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) ,  Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Edition:   161st edition
Volume:   162
Dimensions:   Width: 15.20cm , Height: 2.00cm , Length: 22.90cm
Weight:   0.530kg
ISBN:  

9780123813169


ISBN 10:   0123813166
Pages:   296
Publication Date:   06 August 2010
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1. Energy Filtered X-ray Photoemission electron microscopy(EXPEEM) - Kiyotaka Asakura 2. Image contrast in aberration-corrected scanning confocal electron microscopy - E.C. Cosgriff 3. Comparison of color demosaicing methods - O. Lossona 4. New dimensions for field emission: effects of structure in the emitting surface - C. J. Edgcombe 5. Conductivity Imaging and Generalised Radon Transform: a review - Archontis Giannakidis 6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin

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Author Information

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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