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OverviewAdvances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of Field-emission Source Mechanisms and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC. Full Product DetailsAuthor: Kevin Jensen , Peter W Hawkes , Peter W HawkesPublisher: Academic Press Imprint: Academic Press ISBN: 9781281100054ISBN 10: 1281100056 Pages: 360 Publication Date: 10 January 2010 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |