Overview
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Full Product Details
Author: Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) ,
Tom Mulvey (Xerox Corporation, Palo Alto, California, U.S.A.) ,
Peter W. Hawkes (Aston University, Department of Electronic Engineering and Applied Physics, U.K.) ,
Benjamin Kazan (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)
Publisher: Elsevier Science Publishing Co Inc
Imprint: Academic Press Inc
Volume: v. 109
Dimensions:
Width: 15.20cm
, Height: 2.60cm
, Length: 22.90cm
Weight: 0.730kg
ISBN: 9780120147519
ISBN 10: 0120147513
Pages: 453
Publication Date: 28 September 1999
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Out of Print
Availability: In Print
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.
Reviews
Praise for the Series Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf. --MRS BULLETIN With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest. --J.A. Chapman in LABORATORY PRACTICE
Praise for the Series Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf. --MRS BULLETIN With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest. --J.A. Chapman in LABORATORY PRACTICE
Author Information
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.
