Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

Author:   Jian Min Zuo ,  John C.H. Spence
Publisher:   Springer-Verlag New York Inc.
Edition:   1st ed. 2017
ISBN:  

9781493966059


Pages:   729
Publication Date:   26 October 2016
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience


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Author:   Jian Min Zuo ,  John C.H. Spence
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   1st ed. 2017
Dimensions:   Width: 15.50cm , Height: 4.40cm , Length: 23.50cm
Weight:   1.641kg
ISBN:  

9781493966059


ISBN 10:   1493966057
Pages:   729
Publication Date:   26 October 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Reviews

“This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy … . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work.” (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)


This book is more about imaging and diffraction; although the knowledge covered makes it easier to understand energy-dispersive spectroscopy and electron energy-loss spectroscopy ... . This book would be a good choice for students or researchers who have some knowledge and experience and are seeking a better understanding of TEM or are planning in-depth microstructural analysis work. (Wanfeng Li, MRS Bulletin, Vol. 43, April, 2018)


Author Information

Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society. John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).

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