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OverviewFull Product DetailsAuthor: Jonathan Lee HelmPublisher: Taylor & Francis Ltd Imprint: Routledge Weight: 0.380kg ISBN: 9780367336424ISBN 10: 0367336421 Pages: 216 Publication Date: 20 July 2021 Audience: Professional and scholarly , College/higher education , Professional & Vocational , Postgraduate, Research & Scholarly Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1 An Introduction to Advanced Multitrait-Multimethod Analysis 2 Multitrait-Multimethod Matrix: Method in the Madness 3 Restricted Correlated Trait - Correlated Method Models for Analyzing Multitrait - Multimethod Data 4 Musing on Alternate Confirmatory Factor Models for Multitrait - Multimethod Data 5 Rank Deficiencies in a Reduced Information Latent Variable Model 6 Calculating the Probability of Accurate Model Selection for Multitrait - Multimethod Structural Equation Models 7 Construction of Informative Priors for the Application of CFA - MTMM Models in Small Samples: A Model - Free Approach 8 Leveraging Component-Based Methods to Improve MTMM Analysis: Exploration and Outlier Detection 9 Analysing Multitrait-Multimethod Data with Exploratory Multivariate Analysis…The French Way: A Multiple Factor Analysis PerspectiveReviewsAuthor InformationJonathan Lee Helm is an Assistant Professor of quantitative psychology at San Diego State University, California, USA. In general, Dr. Helm develops and refines statistical models that measure psychological constructs, and analyze longitudinal data. Tab Content 6Author Website:Countries AvailableAll regions |