|
|
|||
|
||||
OverviewThis second collection on Advanced Measurement and Test II is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis...and back to process and design improvement. This will be an invaluable guide to the topics. Full Product DetailsAuthor: Riza Esa , Yanwen WuPublisher: Trans Tech Publications Ltd Imprint: Trans Tech Publications Ltd Volume: v. 301-303 ISBN: 9783037851975ISBN 10: 303785197 Pages: 2898 Publication Date: October 2011 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Awaiting stock The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||