Advanced Mathematical Tools In Metrology Iii

Author:   Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy) ,  Maurice G Cox (Nat'l Physical Lab, Uk) ,  Franco Pavese (Imeko Tc21, Italy) ,  Caparica D Richter (Physikalisch-technische Bundesanstalt, Germany)
Publisher:   World Scientific Publishing Co Pte Ltd
Volume:   45
ISBN:  

9789810229184


Pages:   300
Publication Date:   05 August 1997
Format:   Hardback
Availability:   In Print   Availability explained
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Advanced Mathematical Tools In Metrology Iii


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Overview

This should be of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvement in scientific and technical knowledge and in instrumentation quality as well as a better use of advanced mathematical tools and in the development of new ones. In this book, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming more and more important in industrial processes.

Full Product Details

Author:   Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy) ,  Maurice G Cox (Nat'l Physical Lab, Uk) ,  Franco Pavese (Imeko Tc21, Italy) ,  Caparica D Richter (Physikalisch-technische Bundesanstalt, Germany)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   45
ISBN:  

9789810229184


ISBN 10:   9810229186
Pages:   300
Publication Date:   05 August 1997
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Parameter estimation as illposed inverse problems - theory and numerical methods, K. Kunisch; wavelet methods in signal processing, P. Maass; bootstrap technique, P. Ciarlini; the technologically and topologically related surface model - 13 constraints for dimensioning, tolerancing and inspection, A. Clement et al; an approximation method for the linearization of 3D metrology problems, L. Mathieu et al; software problems in calibration service - a case study, D. Richter et al; reference data sets for testing software used in metrology, M.G. Cox et al; quality of experimental data in hydrodynamic research, M. Masia et al; mathematical methods for data analysis in medical applications, J. Honerkamp; dipole estimation for MCG-data, E. Krause; identification of distributed parameters - an overview, J. Sprekels; robust alternatives to least squares, W. Stahel; high-dimensional empirical linear prediction, K. Liu; and other papers. (Part contents).

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