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Author:   Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy) ,  Franco Pavese (Imeko Tc21, Italy) ,  Caparica D Richter (Physikalisch-technische Bundesanstalt, Germany) ,  Alistair B Forbes (Nat'l Physical Lab, Uk)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   53
ISBN:  

9789810242169

ISBN 10:   9810242166
Pages:   336
Publication Date:   25 January 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

An efficient algorithm for template matching, I.J. Anderson et al; an application of bootstrap regression to metrological data with errors in both variables, P. Ciarlini and G. Regoliosi; evaluation of lateral shearing interferograms, C. Elster; fusing prior calibration information in metrology data analysis, A.B. Forbes; software engineering related standards and guidelines for metrology, N. Greif and D. Richter; virtual testing - interaction with a composite model using the Internet, N.J. McCormick; mathematical problems in the definition of standards based on scales - the case of temperature, F. Pavese; discussion of methods for the assessment of uncertainties in Monte Carlo particle transport calculations, B.R.L. Siebert; some robust methods for fitting parametrically defined curves or surfaces to measured data, G.A. Watson. (Part contents)

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