Advanced Mathematical And Computational Tools In Metrology V

Author:   Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy) ,  Maurice G Cox (Nat'l Physical Lab, Uk) ,  Eduarda Filipe (Instituto Portugues Da Qualidade, Portugal) ,  Franco Pavese (Imeko Tc21, Italy)
Publisher:   World Scientific Publishing Co Pte Ltd
Volume:   57
ISBN:  

9789810244941


Pages:   392
Publication Date:   12 March 2001
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Advanced Mathematical And Computational Tools In Metrology V


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Author:   Patrizia Ciarlini (Inst Per Le Applicazione Del Calcolo ""M Picone"", Roma, Italy) ,  Maurice G Cox (Nat'l Physical Lab, Uk) ,  Eduarda Filipe (Instituto Portugues Da Qualidade, Portugal) ,  Franco Pavese (Imeko Tc21, Italy)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   57
Dimensions:   Width: 16.20cm , Height: 2.50cm , Length: 23.00cm
Weight:   0.667kg
ISBN:  

9789810244941


ISBN 10:   9810244940
Pages:   392
Publication Date:   12 March 2001
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Discrete B-splines approximation in a variety of norms, I.J. Anderson and D.A. Turner; local and global calibration of coordinate measuring machines, S.D. Antunes et al; interactive bootstrap computing on the Internet, P. Ciarlini et al; use of Monte Carlo simulation for uncertainty evaluation in metrology, M.G. Cox et al; assessment of current methods of analysis for quantitative in-vivo magnetic resonance spectroscopy, C. Elster et al; the mutual recognition arrangement (MRA) - recognizing national traceability, E. Filipe; self-calibration and error separation in metrology, A.B. Forbes and I.M. Smith; mathematical model adequacy in metrology - step-by-step approach, V.A. Granovsky and T.N. Siraya; databases in metrology - requirements and solutions, V. Hartmann et al; tools for quality testing of batches of artifacts - the cryogenic thermometers for the LHC, D. Ichim et al; Bayesian approaches to data fusion in metrology, G.P. Kelly; estimators for key comparison reference values, R. Kohler; an algorithm for on-line outlier rejection by sequence analysis in data acquisition, F. Pavese et al. (Part contents).

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