Advanced Information-Measuring Technologies and Systems I

Author:   Volodymyr Eremenko ,  Artur Zaporozhets
Publisher:   Springer International Publishing AG
Edition:   2024 ed.
Volume:   439
ISBN:  

9783031407208


Pages:   277
Publication Date:   20 September 2024
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $475.17 Quantity:  
Add to Cart

Share |

Advanced Information-Measuring Technologies and Systems I


Add your own review!

Overview

The book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine ""Ihor Sikorskyi Kyiv Polytechnic Institute"". The presented results cover almost all scientific directions related to information and measurement technologies—metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories.

Full Product Details

Author:   Volodymyr Eremenko ,  Artur Zaporozhets
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   2024 ed.
Volume:   439
ISBN:  

9783031407208


ISBN 10:   3031407202
Pages:   277
Publication Date:   20 September 2024
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Preface.- Contents.- Metrological Support of Measurement Channels with Bridge Circuits.- Application of Exponential Splines in the Measurement and Control of Electric Circuit Parameters.- Improving of Methods of Impedance Parameters Units Reproduction and Measurement Accuracy Increasing for Ensuring Metrological Traceability.- Implementation of Information and Measurement Systems at the Base Specialized Internet Protocols.- Model of Information Signals Formation in the Diagnostics of Composite Products.- Theory and Practice of Ensuring the Validity in Testing Laboratories.- Methodology for Controlling Greenhouse Microclimate Parameters and Yield Forecast Using Neural Network Technologies.

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List