Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction

Author:   Rolf Erni (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)
Publisher:   Imperial College Press
ISBN:  

9781848165366


Pages:   348
Publication Date:   01 September 2010
Format:   Hardback
Availability:   In Print   Availability explained
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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction


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Author:   Rolf Erni (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)
Publisher:   Imperial College Press
Imprint:   Imperial College Press
Dimensions:   Width: 16.80cm , Height: 2.00cm , Length: 24.90cm
Weight:   0.771kg
ISBN:  

9781848165366


ISBN 10:   1848165366
Pages:   348
Publication Date:   01 September 2010
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

High Resolution Transmission Electron Microscopy; Scanning Transmission Electron Microscopy; Limits of Conventional Electron Microscopy; Basic Principles of Electron Optics; Gaussian Dioptrics; Aberrations; Aberration Correctors; Practical Aspects of Aberration-Corrected Transmission Electron Microscopy; Practical Aspects of Aberration-Corrected Scanning Transmission Electron Microscopy.

Reviews

"Aberration-Corrected Imaging in Transmission Electron Microscopy is impeccably edited. The schematic diagrams are accurate and informative. The equations presented are necessary and sufficient Practical aberration-corrected instruments have been a long time coming but are still very expensive. -- Physics Today ""Physics Today"" The layout of the text is excellent and I particularly like the fact that the two introductory chapters on HRTEM and STEM stand on their own as introductions to the field that serve as a prelude to an elegant narrative. To the list of essential texts for any student of high-end -- Infocus ""Infocus"" It definitely lives up to its promise: carefully written, very knowledgeable, it will enable readers to understand what aberration correction is all about. The account of electron optics that precedes the section on aberration correction is methodical and the treatment of real and asymptotic cardinal elements, often neglected, is exemplary. -- Ultramicroscopy ""Ultramicroscopy"""


It definitely lives up to its promise: carefully written, very knowledgeable, it will enable readers to understand what aberration correction is all about. The account of electron optics that precedes the section on aberration correction is methodical and the treatment of real and asymptotic cardinal elements, often neglected, is exemplary. -- Ultramicroscopy Ultramicroscopy Aberration-Corrected Imaging in Transmission Electron Microscopy is impeccably edited. The schematic diagrams are accurate and informative. The equations presented are necessary and sufficient Practical aberration-corrected instruments have been a long time coming but are still very expensive. -- Physics Today Physics Today The layout of the text is excellent and I particularly like the fact that the two introductory chapters on HRTEM and STEM stand on their own as introductions to the field that serve as a prelude to an elegant narrative. To the list of essential texts for any student of high-end -- Infocus Infocus


The layout of the text is excellent and I particularly like the fact that the two introductory chapters on HRTEM and STEM stand on their own as introductions to the field that serve as a prelude to an elegant narrative. To the list of essential texts for any student of high-end -- Infocus Infocus


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