Aberration-Corrected Analytical Electron Microscopy
Author:   Rik Brydson (University Of Leeds)
Publisher:   Not Avail
ISBN:  

9786613204578


Pages:   306
Publication Date:   18 July 2011
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Aberration-Corrected Analytical Electron Microscopy


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Overview

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Full Product Details

Author:   Rik Brydson (University Of Leeds)
Publisher:   Not Avail
Imprint:   Not Avail
ISBN:  

9786613204578


ISBN 10:   6613204579
Pages:   306
Publication Date:   18 July 2011
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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