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OverviewThe book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS). Full Product DetailsAuthor: Rik Brydson (University Of Leeds University of Leeds, UK University of Leeds, UK University Of Leeds University Of Leeds University Of Leeds University Of Leeds University Of Leeds) , Rik Brydson (University Of Leeds University of Leeds, UK University of Leeds, UK University Of Leeds University Of Leeds University Of Leeds University Of Leeds University Of Leeds)Publisher: Wiley Imprint: Wiley ISBN: 9781283204576ISBN 10: 1283204576 Pages: 306 Publication Date: 01 January 2011 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |