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OverviewThe methods presented in this book are imaging methods, ie they allow to obtain an image of the sample. We present the most useful materials science methods, ie one that has been most recently used to be linked to the analysis of material properties. The book presents some of the methods most widely applied to materials science: tomographic probe subsequent, mechanical or FIB polishing electron tomography X-ray tomography Full Product DetailsAuthor: Buffière , Eric MairePublisher: ISTE Ltd and John Wiley & Sons Inc Imprint: ISTE Ltd and John Wiley & Sons Inc Dimensions: Width: 15.00cm , Height: 1.50cm , Length: 25.00cm Weight: 0.666kg ISBN: 9781848216396ISBN 10: 1848216394 Pages: 352 Publication Date: 28 November 2014 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationJean-Yves BUFFIÈRE and Eric MAIRE are both Professors at INSA-Lyon, France. Tab Content 6Author Website:Countries AvailableAll regions |