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OverviewExplains how to assess and handle technical risk, schedule risk, and cost risk efficiently and effectively--enabling engineering professionals to anticipate failures regardless of system complexity--highlighting opportunities to turn failure into success. Full Product DetailsAuthor: John X. Wang , Marvin L. Roush , Marvin L. RoushPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Volume: v. 36 Dimensions: Width: 15.20cm , Height: 1.70cm , Length: 22.90cm Weight: 0.650kg ISBN: 9780824793012ISBN 10: 0824793013 Pages: 264 Publication Date: 15 February 2000 Audience: College/higher education , General/trade , Professional and scholarly , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsThis is the finest book that I have ever seen on Risk Assessment. It provides a detailed analytical approach with a sound scientific basis. The examples are very easy to follow and equations are easy to apply. All good designers should apply this approach in any design where there is a potential for loss of life or destruction of equipment. ---Richard L. Doyle, PE Past President, Institute of Electrical and Electronics Engineers Principle, Doyle and Associates La Jolla, California It is the best and most interesting engineering book that I have ever read. . ..The history sections keep the reader very interested and in the process make it easy to learn the engineering aspects. . .. . . .the book is very easy to read and is an excellent teaching guide. It contains very good and easy to understand examples and explanations. I have remembered what I have learned because I could relate to the book so well. I also found myself looking at things differently to make sure that all risk has been assessed. ---Mary Jo Armstrong Project Management for Aerospace Lord Corporation Erie, Pennsylvania Author InformationJohn X. Wang, Marvin L. Roush, Marvin Tab Content 6Author Website:Countries AvailableAll regions |