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OverviewStatistical investigation into technology not only provides a better understanding of the intrinsic features of the technology (analysis), but also leads to an improved design of the technology (synthesis). Physical principles and mathematical procedures of medical imaging technologies have been extensively studied during past decades. However, less work has been done on their statistical aspect. Filling this gap, this book provides a theoretical framework for statistical investigation into medical technologies. Rather than offer detailed descriptions of statistics of basic imaging protocols of X-ray CT and MRI, the book presents a method to conduct similar statistical investigations into more complicated imaging protocols. Full Product DetailsAuthor: Tianhu Lei (University of Pittsburgh, Pennsylvania)Publisher: CRC Press Imprint: CRC Press ISBN: 9786613908551ISBN 10: 661390855 Pages: 426 Publication Date: 22 December 2011 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |