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OverviewFull Product DetailsAuthor: Donald O. Thompson , Dale E. ChimentiPublisher: Springer Science+Business Media Imprint: Kluwer Academic/Plenum Publishers Edition: 1995 ed. Volume: 14 Weight: 4.830kg ISBN: 9780306450624ISBN 10: 0306450623 Pages: 1208 Publication Date: 31 May 1995 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsMinisymposium.- 1. Standard Techniques.- 2. Emerging Inspection Technologies.- 3. Interpretive Signal Processing and Image Analysis.- 4. Transducers Sensors and Process Control.- 5. Engineered Materials.- 6. Material Properties.- 7. Materials’ Degradation And Specific Applications.- 8. NDE Systems, Reliability, and Transferability.- Attendees.- Contributors Index.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |