Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements

Author:   Krzysztof Iniewski (Redlen Technologies Inc., Canada.) ,  Jan S. Iwanczyk (DxRay Inc., USA.)
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9780367707156


Pages:   344
Publication Date:   05 November 2021
Format:   Hardback
Availability:   In Print   Availability explained
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Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements


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Author:   Krzysztof Iniewski (Redlen Technologies Inc., Canada.) ,  Jan S. Iwanczyk (DxRay Inc., USA.)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   0.598kg
ISBN:  

9780367707156


ISBN 10:   0367707152
Pages:   344
Publication Date:   05 November 2021
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1. CdZnTe and CdTe Crystals for Medical Applications. 2. A First Principle Method to Simulate the Spectral Response of CdZnTe-Based X- and Gamma-Ray Detectors. 3. Application Specific Geometric Optimization of CdTe and CdZnTe Detector Arrays. 4. Photon-Integrating Hybrid Pixel Array Detectors for High-Energy X-Ray Applications. 5. Position-Sensitive Virtual Frisch-Grid Detectors for Imaging and Spectroscopy of Gamma Rays. 6. Detector Design for Surgical Guidance. 7. Development of Energy-Integrating Detectors for Large-Area X-Ray Imaging. 8. Silicon Photomultipliers in Scintillation Detectors for Nuclear Medicine. 9. Tip Avalanche Photodiode – a New Wide Spectral Range Silicon Photomultiplier. 10. Silicon Photomultiplier-Based Scintillation Detectors for Photon-Counting X-Ray Imaging.

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Author Information

Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017. Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.

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