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OverviewCMOS Digital Integrated Circuits: Analysis and Design is the most complete book on the market for CMOS circuits. Appropriate for electrical engineering and computer science, this book starts with CMOS processing, and then covers MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, BiCMOS circuits, I/O circuits, VLSI design methodologies, low-power design techniques, design for manufacturability and design for testability. This book provides rigorous treatment of basic design concepts with detailed examples. It typically addresses both the computer-aided analysis issues and the design issues for most of the circuit examples. Numerous SPICE simulation results are also provided for illustration of basic concepts. Through rigorous analysis of CMOS circuits in this text, students will be able to learn the fundamentals of CMOS VLSI design, which is the driving force behind the development of advanced computer hardware. Full Product DetailsAuthor: Sung-Mo (Steve) Kang , Yusuf LeblebiciPublisher: McGraw-Hill Education - Europe Imprint: McGraw-Hill Professional Edition: 3rd edition Dimensions: Width: 19.30cm , Height: 3.10cm , Length: 23.60cm Weight: 1.173kg ISBN: 9780072460537ISBN 10: 0072460539 Pages: 672 Publication Date: 16 December 2002 Audience: College/higher education , Tertiary & Higher Education Replaced By: 0073380628 Format: Hardback Publisher's Status: Out of Print Availability: In Print Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of Contents1 Introduction 2 Fabrication of MOSFETS 3 MOS Transistor 4 Modeling of MOS Transistors Using SPICE 5 MOS Inverters: Static Characteristics 6 MOS Inverters: Switching Characteristics and Interconnect Effects 7 Combinational MOS Logic Circuits 8 Sequential MOS Logic Circuits 9 Dynamic Logic Circuits 10 Semiconductor Memories 11 Low-Power CMOS Logic Circuits 12 BiCMOS Logic Circuits 13 Chip Input and Output (I/O) Circuits 14 Design for Manufacturability 15 Design for TestabilityReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |